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Supply Sensor Chip (Allegro) ARS19510LUBBTN, ARS19510LUBBTN-RDNPHUJ Magnetic Speed Sensor

Supply Sensor Chip (Allegro) ARS19510LUBBTN, ARS19510LUBBTN-RDNPHUJ Magnetic Speed Sensor

Source:our siteTime:2024-09-06Views:

Shenzhen Mingjiada Electronics Co., Ltd. supplies Sensor Chips (Allegro) ARS19510LUBBTN, ARS19510LUBBTN-RDNPHUJ Magnetic Speed Sensor, Dual-wire Differential Vibration Resistant Sensor ICs with Velocity and Direction OutputsDescription:The ARS19510LUB…

Shenzhen Mingjiada Electronics Co., Ltd. supplies Sensor Chips (Allegro) ARS19510LUBBTN, ARS19510LUBBTN-RDNPHUJ Magnetic Speed Sensor, Dual-wire Differential Vibration Resistant Sensor ICs with Velocity and Direction Outputs


Description:

The ARS19510LUBBTN integrates an advanced Hall effect circuit IC and EMC protection components in a single overmoulded package. The optimised, user-friendly solution provides directional detection and true zero-speed digital gear sensing for challenging environments such as automotive and industrial transmissions as well as a variety of gear sensing applications.


Mingjiada distributes Allegro sensor models:

A1694PKLN-RNZBE

A1694PKLN

A1696PKHTN-CUST-13

A1696PKHTN

A19520LUBBTN-RSNLBYJ

A19520LUBBTN

ARS19510LUBBTN-RDNPHUJ

ARS19510LUBBTN


ARS19510LUBBTN, ARS19510LUBBTN-RDNPHUJ Product Features:

EMC compliance using integrated protection components and advanced IC design methods

Isolation from harsh automotive transients (e.g., switched inductive loads)

Advanced algorithmic options to withstand a full range of abrupt and dynamic air gap changes

Dual-wire, pulse-width output protocols

Highly configurable output protocol options

Target speed and direction information

Vibration tolerance

Weak signal lockout for small amplitude vibrations

Patented vibration detection algorithm for large vibrations

Air gap independent switching points

Undervoltage lockout

True zero speed operation

Wide operating voltage range

Single-chip sensing IC for high reliability

Sweep path and IDDQ measurements for reliable test coverage

Integrated feedback bias magnet


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